Thanks to its wide range of surface characterisation techniques, our materials analysis laboratory can advise you on the technique best suited to your needs.
- Elementary and quantitative analysis of the top atomic layers: from nanometer to a few tenths of micrometers
- Chemical analysis: information about bonds, oxidation states, functional groups
- Molecular analysis
- Trace analysis
- Elements localisation with a high resolution:
- In depth: profiling (from a few nm to a few μm),
- Spatial: elemental and molecular imaging (resolution <1 μm),
- Any solid material analysis, including powders and insulating samples
The performances of each technique are presented in the schema above and table below :
| Name | Technical sheet | Elementary | Quanti | Chemical | Sensibility | Depth profiling | Spot size | Profil | Insulators |
|---|---|---|---|---|---|---|---|---|---|
| XPS |  |
yes | yes | yes | 0,1 % at. | 10 nm | 10 µm | yes -> 1 µm | yes |
| AES | |
yes | yes | yes | 0,1 % at. | 0.1 nm | 10 µm | yes -> 1 µm | no |
| DSIMS | |
yes | difficult | no | ppm-ppb | – | 0.3 µm | yes -> 10 µm | yes |
| SSIMS | |
yes | difficult | yes molecular | femtomole | < 1 nm | 0.3 µm | – | yes |
| GD-OES | |
yes | yes | no | ppm | – | no | yes -> 100 µm | yes (RF) |
| EDS (SEM) | |
yes | yes | no | 0.1 % at. | 1 µm | 1 µm | no | yes |
| FTIR | |
no | no | yes molecular | 1000 ppm | 1 µm | 3 µm | no | yes |
| TEM | |
yes with EDS | yes with EDS | yes with EELS | 1 % at. | 100 nm | down to the nanometre | no | yes |
