Our technical resources

RX-3D-Dage

2D.3D X-ray – X-ray laminography

Fluorescence-X

X-ray fluorescence

Microscopie-acoustique

Acoustic microscopy

ThermographieIR

Infrared thermography

Microscopie-Balayage

Scanning microscopy

Microscopie-optique

Optical microscopy

Balance-mouillage

Wetting balance

pullshear

Pull-shear tester

Laser

Laser package opening

EMMI

Light-emitting microscope

MEB

EDX spectroscopy

Contaminomètre

Contaminometer

herméticité

Leak detector

Traction

Tensile tester

polisseuse

Polisher

TEM_Osiris2

EDX / Super X 4-dial Osiris TEM

V600

Grenoble V600 FIB

ZapmasterMk2

MK2

orion3

Orion 3

XPS-1-min

X ray Photoelectron Spectroscopy (XPS)

FTIR5-1

Microscopy with ATR imageur (FTIR)

GD-OES-1

Glow-Discharge Optical Emission Spectrometry (GD-OES)

ToF4-9-min

Time-Of-Flight – Secondary Ion Mass Spectroscopy (ToF-SIMS)

Profilo

Profilometry

Microscope-optique-1

3D numerical Microscopy

MEB3-min-1024×768

Scanning Electronic Microscopy – Energy Dispersive Spectroscopy (SEM-EDS)

For any questions: