Electrical Test and Reliability

TEST & QUALIFICATION

Automatic Test Equipments, Lab Bench

SOC TESTER : VERIGY PINSCALE 93K

PRODUCTS

- MEMORY (DDR1/2/3), NVM
- HIGH SPEED LINKS JESD204, HDMI, SATA, PCIe
- ADC-DAC High Speed (16 Bits), High resolution (24 BIts)
- FPGA, ASIC
- SOC Devices

MAIN CHARACTERISTICS

- 320 Digital channels PS400, 8Mvectors
- 128 Digital Channels PS3600, 8Mvectors
- MBAV8 (4S/4M) (2 AWG and 2 Digitizers) (16 Bits High Speed and 24 Bits Low Speed)
- 8 MS DPS (Power Supply) (+/-8V / 4A Gangable)

LOGICS & MEMORIES :

- EXA ITS 9000 (256 pins, 100 MHz)
- EXA 3000 SOC mixed (280 pins, 200 MHz).
- Sentry S15 - 128 pins to 20MHz       (x2)
- Sentry 1650 (256pins, 20/40 MHz).  (x2)

ANALOG & MIXED :

- Teradyne A370       (x2)
- HP 9472, LT S2020
- Customized test benches for IGBT, MOS, ADC/DAC under LABVIEW software.
- Applicos 7006 (ADC/DAC 24 Bit low speed and 16 Bit high speed)

DATA MANAGEMENT

EXAMINATOR® from Galaxy

- Gauge R&R
- Characterization reports
- Yield Management

Probe Test

6" and 8" prober EG2001 with hot chuck

Reliability and Test Monitoring

Thermal cycles : Accelerated stress test where product moves between hot and cold air zones

Thermal shock : Accelerated stress test where product moves between hot and cold liquid baths

Temperature & humidity : Product storage in temp & humidity Atmosphere

HAST : Highly accelerated stress test in moisture under pressure

High temperature storage, Burn-in : Accelerated stress test in a high temperature

Autoclave / Pressure cooker : Accelerated stress test in moisture under pressure

Preconditioning : A moisture level simulation (from assembly to mounting)

Vibration HALT (-100°C / +250°C ; 70 C/mn ; 70 g)