FIB Experiment

Electrical Expertise - IC modification with FIB

The FIB (Focused Ion Beam) allows intervention on the different metallized layers of the IC, in order to :

• Validate an evolution for a new product
• Anticipate the release of this new product
• Make a prototype for the final customer
• As a step for the electrical characterization and failure analysis.

Types of Intervention :

• Functions Correction / Modification :
> cutting metal tracks
> adding new tracks.
• Adding tests points for measurement purposes.

Other uses for FIB :

• Microsection for physical characterization.
• Sample preparation for TEM observation > Read more
• Micro-tooling : engraving and layer adding on micron scale.

Equipment :

• FIB FEI 200 with a CAD station.